Explore the diverse range of workshops offered at Alabama Materials Institute 2025 Open House. Learn from experts in the field and enhance your skills in materials analysis. Sign-up on site.

Workshop 1: Analyzing S/TEM Data with Python
Professor Colin Ophus, Stanford University
This hands-on workshop introduces Python tools for analyzing scanning transmission electron microscopy (S/TEM) data, with a focus on 4D-STEM diffraction. Participants will explore analysis and simulation workflows using py4DSTEM, quantem, and abTEM through guided tutorials using Google Colab.
- Intro & Setup: Overview of S/TEM data types, Python tools, and detector considerations.
- Orientation & Phase Mapping: Identify crystal orientation and phase using Bragg disk matching.
- Strain Mapping: Measure nanoscale strain fields from disk positions and cepstral transforms.
- Phase Contrast Imaging: Use DPC, parallax, and ptychography to reconstruct phase information.
- Quantem examples: STEM imaging drift correction, 3D tomographic reconstruction.
- Simulate TEM experiments using py4DSTEM and abTEM.
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Participants will bring their own laptop and have a google login account.

Workshop 2: FIB-SEM in Focus: From Basics to Advanced Techniques
Rick Passey, Sr. Manager - Product Specialists, Thermo Fisher Scientific, Inc.
This two-session practical workshop on Focused Ion Beam Scanning Electron Microscopy (DualBeam FIB-SEM) is designed to accommodate users of all experience levels. Participants may choose to attend one or both sessions. The first session is tailored for new or beginner users, covering the fundamentals of Focused Ion Beam-Scanning Electron Microscopy. The second session is intended for more advanced users, diving deeper into complex applications and techniques. Both sessions will feature hands-on demonstrations using the Thermo Scientific Helios 5 (UX or Hydra) to illustrate key principles and best practices.

Workshop 3: Introduction of Atom Probe Tomography
Drs. San Deb & Eshita Samajpati, Alabama Materials Institute
This workshop introduces atom probe tomography (APT), covering the fundamental principles of the method, data collection, reconstruction, and other analysis techniques, as well as specimen preparation methods. Attendees will also have the opportunity to participate in a live demonstration of the technique and learn how the Local Electrode Atom Probe operates.

Workshop 4: The Surface Speaks: Exploring Materials with XPS
Dr. Lu Ping, Scientist III - Field Applications, Thermo Fisher Scientific, Inc.
This introductory workshop on X-ray Photoelectron Spectroscopy (XPS) will be offered in two identical sessions to accommodate scheduling needs. Designed for new or beginner users, each session will cover the fundamental principles of XPS, sample preparation, data acquisition, and basic analysis. Dr. Lu Ping will demonstrate techniques live on the Thermo Scientific Nexsa G2 XPS, offering practical insights and answering questions throughout. Whether you're new to surface analysis or looking to refresh your skills, this workshop provides a solid foundation in XPS.

Workshop 5: In situ Nanomechanical Testing and Visualizing Deformation in SEM and TEM
Dr. Eric Hintsala, Bruker Hysitron, Minneapolis, MN
The combination of high-resolution electron microscopy imaging and nanomechanical testing in situ provides detailed insights into deformation mechanisms and how they relate to the local materials structure. In a nanoindentation mode with a pyramidal probe, or utilizing focused ion beam machining to do uniaxial compression, these methods can be highly localized to evaluate critical components of materials microstructures that are not typically accessible from larger scale methods. Where compression testing offers detailed insight into stress-strain behavior and the accompanying deformation mechanisms, nanoindentation can map out hardness/modulus in a high-throughput manner that can be correlated with maps from other characterization methods.

Workshop 6: Exploring Atoms: Advanced Imaging & Analysis with (S)TEM
Dr. Lee Casalena, Sr. TEM Product Specialist, Thermo Fisher Scientific, Inc.
Our advanced workshop on Transmission Electron Microscopy (TEM) and Scanning Transmission Electron Microscopy (STEM) will be tailored for experienced users working with complex and emerging materials down to the atomic scale. This session will focus on state-of-the-art imaging and elemental characterization techniques utilizing the Thermo Scientific Spectra 300 (S)TEM, including high-resolution imaging and various comprehensive analytical techniques. Through live, hands-on demonstrations on the instrument, the Dr. Lee Casalena will showcase how to extract structural and compositional information with precision. Ideal for researchers seeking deeper insight into the capabilities of (S)TEM, this workshop will emphasize practical approaches to advanced materials characterization.